
Page 3 of 97 Report No. 236145
TRF No. IEC60335_2_40F
Testing procedure and testing location:
CB/CCA Testing Laboratory: N/A
Testing location/ address ........................ :
Associated CB Laboratory:
N/A
Testing location/ address ........................ :
Tested by (name + signature) .......:
Approved by (+ signature) .............:
Testing procedure: TMP
Tested by (name + signature) .......:
Jae Hyeon, Kim
Approved by (+ signature) ............. :
Jae Hong, Park
Testing location/ address ........................ :
Samsung Electronics Co., Ltd.
Digital Air-solutions Business Team,
129, Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do,
443-742 Korea, Republic of
Testing procedure: WMT N/A
Tested by (name + signature) .......:
Witnessed by (+ signature) ........... :
Approved by (+ signature) .............:
Testing location/ address ........................ :
Testing procedure: SMT N/A
Tested by (name + signature) .......:
Approved by (+ signature) .............. :
Supervised by (+ signature) ..........:
Testing location/ address ........................ :
Testing procedure: RMT N/A
Tested by (name + signature) .......:
Approved by (+ signature) .............. :
Supervised by (+ signature) ..........:
Testing location/ address ........................ :
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